Submicron IDT wave field investigation by scanning acoustic force microscopy
Proceedings of the IEEE Ultrasonics Symposium 2 (1996) 815-818
Abstract:
We report about a new technique for the investigation of SAW fields within SAW devices reaching submicron lateral resolution. The scanning acoustic force microscope (SAFM) is based on a standard force microscope and utilizes the nonlinear force curve in the sense of a mechanical diode. Varying wave amplitudes therefore lead to different shifts of the cantilever's rest position. With SAFM we investigated SAW devices with center frequencies above 600 MHz. We found a local effect of massloading on the standing wave amplitude within IDTs. Furthermore, we measured the dynamic behavior of the IDT's wave pattern when sweeping the frequency.Direct visualization of the oscillation of Au (111) surface atoms
Applied Physics Letters 69:3 (1996) 354-356
Abstract:
A high frequency oscillating Au (111) surface was measured with atomic resolution using a modified scanning tunneling microscope. On the atomic scale propagating surface acoustic waves lead to oscillations of atoms on elliptical trajectories, with the axes being determined by the material parameters of the surface. Since those oscillation frequencies are much higher than the scan frequencies the topography contrast is reduced. This basic problem is solved by measuring a stroboscopic snapshot seeing a defined state of oscillation. The atomic resolution of the phase and the amplitude contrast is explained by the superposition of the surface topography and the oscillation trajectory. © 1996 American Institute of Physics.Microprobe techniques in SAW measurements
Proceedings of the XI Intern. Microwave Conf. MIKON-96 (1996) 107-111
Wellenfelder in Interdigitalwandlern und ihre Abstrahlung
Fortschritte der Akustik – DAGA96 DEGA (1996) 434-435
Microprobe techniques in SAW measurements
Archives of Acoustics Polish Academy of Sciences 21:2 (1996) 195-200