Publications associated with Oxide Electronics

Depth-resolved magnetization dynamics revealed by x-ray reflectometry ferromagnetic resonance

Physical Review Letters American Physical Society 125 (2020) 137201

D Burn, S Zhang, G Yu, Y Guang, H Chen, X Qiu, G van der Laan, T Hesjedal

Magnetic multilayers offer diverse opportunities for the development of ultrafast functional devices through advanced interface and layer engineering. Nevertheless, a method for determining their dynamic properties as a function of depth throughout such stacks have remained elusive. By probing the ferromagnetic resonance (FMR) modes with element-selective soft x-ray resonant reflectivity, we gain access to the magnetization dynamics as a function of depth. Most notably, using reflectometry ferromagnetic resonance (RFMR), we find a phase lag between the coupled ferromagnetic layers in [CoFeB/MgO/Ta]4 multilayers, which is invisible to other techniques. RFMR enables the time- and layer-resolved probing of the complex magnetization dynamics of a wide range of functional magnetic heterostructures with absorption edges in the soft x-ray wavelength regime.

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