Scanning Electron Microscopy

The Department of Physics has two state-of-the-art FEI scanning electron microscopes for high-resolution imaging, structural characterisation and elemental analysis using EDX.

FEI Quanta Inspect S

The Quanta Inspect S is a user-friendly SEM with an intuitive modern software interface. It is capable of imaging a wide variety of samples with minimum preparation, including conductive and non-conductive specimens and samples that are incompatible with the high-vacuum environment of a conventional SEM chamber.

The system has dedicated detectors both for secondary electrons and for backscattered electrons, providing the ability to image either surface topography or phase distribution.

FEI Quanta 600 FEG

The Quanta 600 FEG extends the capabilities of the Quanta Inspect S by providing an Environmental SEM mode. In environmental (ESEM) mode the temperature of the sample, and the relative humidity and pressure of its environment are closely controlled, which allows the imaging of out-gassing and hydrated specimens.

The instrument has a high-brightness electron source which is ideal for EDS/EDX microanalysis. The system incorporates an Oxford Instruments INCA Energy detector which can be used for quantitative compositional analysis and spatial elemental mapping.

These instruments are located in the Clarendon Laboratory and are available to members of the University, but we encourage enquiries from outside the University, including academic, commercial and industrial users.

Potential users should contact the Facility Manager: Dr Jason Brown.