X-ray and Materials properties facility

What we do

We provide state-of-the-art X-ray crystallography facilities and instrumentation to characterize samples using techniques such as magnetization, specific heat and resistivity using our highly adaptable Quantum Design PPMS and MPMS instruments.

Panalytical X'pert PRO powder diffractometer.

X-ray source: Cu anode. Sample changer with 12 slots. Furnace stage up to 600 C.

Agilent SupaNova Kappa diffractometer

Our Oxford Diffraction Supernova diffractometer
X-ray source: Mo anode (50W tube, microfocus optics, 50kV, 1mA), 2Theta angle: -115° - +157° (0.00125° resolution) Sphere of Coincidence R: 10um Detector active area: 135mm diameter. Temperature ranges: Helijet 10K-100 K; Cryostream 80K-500K. Extra-large enclosure for custom-built setups.

Phillips X'pert Pro MRD

X-ray source: Cu anode. 4-bounce monochromator and analyser. Optimised for films and multilayers.

Custom-built Laue diffractometer

For single-crystal aligment (compatible with cutting stage)

PPMS

An example heat capacity measurement: the frustrated magnet GeNi2O4 shows two magnetic transitions
Our Physical Properties Measurement System (PPMS) allows measurements of specific heat, resistivity and magnetic properties in applied magnetic fields up to 14 T. The standard sample environment provides temperature control over the range 1.9 - 400 K, and our He3 insert allows you to reach temperatures down to 500 mK. Versatile sample mounts couple to electrical leads in the cryostat insert providing the possibility for you to easily adapt the apparatus to your own experiment.

MPMS

The MPMS system: our SQUID magnetometer

Our Magnetic Properties Measurement System (MPMS) is a magnetometer based on Superconducting Quantum Interference Device (SQUID) technology. It provides sensitive magnetometry in a temperature range 1.9 - 400 K, in applied magnetic fields of up to 7 T.