Publications by Todd Huffman


Charge collection in irradiated HV-CMOS detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment (2018)

B Hiti, A Affolder, K Arndt, R Bates, M Benoit, FD Bello, A Blue, D Bortoletto, M Buckland, C Buttar, P Caragiulo, D Das, D Doering, J Dopke, A Dragone, F Ehrler, V Fadeyev, W Fedorko, Z Galloway, C Gay, H Grabas, IM Gregor, P Grenier, A Grillo, Y Han, M Hoeferkamp, LBA Hommels, T Huffman, J John, K Kanisauskas, C Kenney, G Kramberger, Z Liang, I Mandić, D Maneuski, F Martinez-Mckinney, S McMahon, L Meng, M Mikuž, D Muenstermann, R Nickerson, I Peric, P Phillips, R Plackett, F Rubbo, L Ruckman, J Segal, S Seidel, A Seiden, I Shipsey, W Song, M Stanitzki, D Su, C Tamma, R Turchetta, L Vigani, J Volk, R Wang, M Warren, F Wilson, S Worm, Q Xiu, J Zhang, H Zhu

© 2018 Elsevier B.V. Active silicon detectors built on p-type substrate are a promising technological solution for large area silicon trackers such as those at the High Luminosity LHC, but the radiation hardness of this novel approach has to be evaluated. Active n-in-p strip detector prototypes CHESS2 for ATLAS with different substrate resistivities in the range of 20–1000 Ωcm were irradiated with neutrons and protons up to a fluence of 2×10 15 n eq cm −2 and 3.6×10 15 n eq cm −2 . Charge collection in passive test structures on the chip was evaluated using Edge-TCT and minimum ionising electrons from 90 Sr. Results were used to assess radiation hardness of the detector in the given fluence range and to determine parameters of initial acceptor removal in different substrates.


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