Publications associated with Thin Film Quantum Materials


Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure

PHYSICAL REVIEW B 94 (2016) ARTN 174107

AI Figueroa, SL Zhang, AA Baker, R Chalasani, A Kohn, SC Speller, D Gianolio, C Pfleiderer, G van der Laan, T Hesjedal


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